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Publication no #109   Download bibtex file Type :   Html | Bib | Both
    Created: 2011-06-16 15:42:44     Modified: 2016-03-24 16:17:48
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Jongeun Lee and Aviral Shrivastava. Static Analysis of Register File Vulnerability. In IEEE TVLSI: IEEE Transactions on Very Large Scale Integrated circuits, Vol. 30(4):606-616, April 2011. PDF [Comment]   Bibtex entry
Keywords: Soft Error.  

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Last modified: Mon November 22 2010 16:16:55
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